![]() The nature of energy generating requires the unique load sweep for light forward I-V curve that used to derive most of the important parameters of a solar cell. Solar Cell has diode structure which can be characterized by I-V sweep. The duel input channels design of Chroma 52400 series SMU together with synchronous measurement is capable to cover all the test needs in one module to achieve smallest footprint and highest channel density when multiple DUTs need to be test. Another important feature for SMU is, it is capable to compensate the voltage drop over the cable to ensure the photo diode to true short circuit condition while typical current shunt type of current measurement setup may cause voltage burden issue. The optical power is proportional to the short circuit of the photo diode, fail to bias the photo diode to zero volt may have less accurate measurement result because the forward voltage of photo diode has higher temperature coefficient impact than the short circuit current. Photo diode is normally used to be an optical power sensor. Optical power measurement requires another measurement input. SMU is capable to be set as current source mode to drive the DUT to test the forward characteristics and being set as voltage sourcing mode for reverse performance. Light emitting devices such as LEDs or Laser Diodes requires sourcing, loading and optical power measurement when conducting parametric test for LIV as well as reverse characteristics. By appropriately sweep and voltage or current on different channels, user may get various MOSFET I-V characteristics. The source terminal of the MOSFET is connected to the Force Lo (-Force) terminals of both SMU channels. By using Chroma 52400 series SMU, user can quickly and accurately source and measure both current and voltage.Īs indicated, The Force Hi (+Force) terminal of 52400 SMU CH1 is connected to the gate of the MOSFET and the Force Hi terminal of 52400 SMU CH2 is connected to the drain. Programming and synchronizing multiple instruments is crucial to ensure correct test result. These I-V tests may include gate leakage, breakdown voltage, drain current, etc. The Current-Voltage (I-V) Characterization is crucial to ensure FET meet specifications and work properly. The voltage dip is caused by internal series resistance of battery when burst of current drain by DUT. In the case when battery will be used as DPS of the DUT, unique programmable resistance feature of Chroma 52400 series SMU is capable to produce voltage dip that observed in real battery setup. To meet this requirement, Chroma 52400 series SMU provides up to 10 current measurement ranges and 100k s/S sampling rate to ensure high speed and precision measurement for both burst or quasi-state current measurement. As a result, wide dynamic range of input current needs to be measured at high speed as well as high precision. The long operation time requirement makes energy saving mode a common design for modern semiconductor devices. With popularity of mobile applications, the DPS can be a voltage source from DC/DC converter or sometimes battery. All of these features enable easy integration to PXI or PXI-hybrid systems designed for a wide range of applications.Īpplications DPS & Battery Simulation for Semiconductor Testĭevice Power Supply (DPS) is a voltage source used to drive semiconductor ICs. The back connectors are compatible with both PXIe and hybrid chassis. No PC communication is required during execution of the hardware sequencer test process.Ĭ, C#, LabView, LabWindows APIs and versatile soft front panels come standard with each SMU. The sequencer's on-board memory can store up to 65535 sequencer commands and 32k measurement samples per channel, allowing cross module/card synchronizat ion and latency free output control and measurement. The 52400 series has a patented hardware sequence engine that uses deterministic timing to control each SMU. The 52400 series features: 16 selectable control bandwidths to ensure high speed output and stable operation multiple source/measure ranges with an 18-bit DAC/ADC to provide the best resolution and accuracy available with a sampling rate up to 100K s/S programmable internal series resistance for battery simulation ±force, ±sense and ±guards lines to avoid leakage current and reduce settling time - especially useful for low current test applications. This makes the SMU an ideal instrument in many parametric test applications ranging from ICs, two-leaded components such as sensors, LEDs, laser diodes, transistors, to solar cells, batteries and many other electronic devices. The SMU combines four-quadrant operation with precision and high speed measurement. The Chroma 52400 series is a PXI based SMU (Source Measurement Unit) card designed for highly accurate source or load simulation with precision voltage and current easurements.
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